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Stochastic model for single photon counting measurements

TitleStochastic model for single photon counting measurements
Publication TypeConference Paper
Year of Publication2003
Publication Languageeng
AuthorsNádai, L., and P. Várlaki
Conference NameIEEE International Symposium on Intelligent Signal Processing, (From Classical Measurement to Computing with Perceptions), WISP-2003
Date PublishedSeptember
Conference LocationBudapest, Hungary

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