Correlation between the critical layer thickness and the decay time constant of RHEED oscillations in strained InxGa1-xAs/GaAs structures
| Title | Correlation between the critical layer thickness and the decay time constant of RHEED oscillations in strained InxGa1-xAs/GaAs structures |
| Publication Type | Journal Article |
| Year of Publication | 2000 |
| Authors | Nemcsics, Á. |
| Journal | THIN SOLID FILMS |
| Volume | 367 |
| Pagination | 302 - 305 |
| Date Published | 2000 |
| Publication Language | eng |