An x-ray diffraction study of the structural properties of thick relaxed (100) InGaAs/GaAs heterostructures
| Title | An x-ray diffraction study of the structural properties of thick relaxed (100) InGaAs/GaAs heterostructures |
| Publication Type | Journal Article |
| Year of Publication | 2005 |
| Authors | F, R., D. J, and Á. Nemcsics |
| Journal | PHYSICA STATUS SOLIDI C-CONFERENCES AND CRITICAL REVIEWS |
| Volume | 2 |
| Issue | 4 |
| Pagination | 1298 - 1303 |
| Date Published | 2005 |
| Publication Language | eng |
| Abstract | Structural properties of highly mismatched InGaAs/GaAs (100)heterostructures grown by molecular beam epitaxy are studied |