Warning: Table './science/watchdog' is marked as crashed and should be repaired query: INSERT INTO watchdog (uid, type, message, variables, severity, link, location, referer, hostname, timestamp) VALUES (0, 'php', '%message in %file on line %line.', 'a:4:{s:6:\"%error\";s:7:\"warning\";s:8:\"%message\";s:138:\"realpath(): open_basedir restriction in effect. File(/tmp) is not within the allowed path(s): (/var/www/html/science/science.uni-obuda.hu)\";s:5:\"%file\";s:60:\"/var/www/html/science/science.uni-obuda.hu/includes/file.inc\";s:5:\"%line\";i:200;}', 3, '', 'http://science.uni-obuda.hu/en/node/4912', '', '216.73.216.67', 1749555443) in /var/www/html/science/science.uni-obuda.hu/includes/database.mysql.inc on line 135 Warning: Table './science/watchdog' is marked as crashed and should be repaired query: INSERT INTO watchdog (uid, type, message, variables, severity, link, location, referer, hostname, timestamp) VALUES (0, 'php', '%message in %file on line %line.', 'a:4:{s:6:\"%error\";s:7:\"warning\";s:8:\"%message\";s:138:\"realpath(): open_basedir restriction in effect. File(/tmp) is not within the allowed path(s): (/var/www/html/science/science.uni-obuda.hu)\";s:5:\"%file\";s:60:\"/var/www/html/science/science.uni-obuda.hu/includes/file.inc\";s:5:\"%line\";i:200;}', 3, '', 'http://science.uni-obuda.hu/en/node/4912', '', '216.73.216.67', 1749555443) in /var/www/html/science/science.uni-obuda.hu/includes/database.mysql.inc on line 135 An x-ray diffraction study of the structural properties of thick relaxed (100) InGaAs/GaAs heterostructures | science.uni-obuda.hu
Skip to main content

An x-ray diffraction study of the structural properties of thick relaxed (100) InGaAs/GaAs heterostructures

TitleAn x-ray diffraction study of the structural properties of thick relaxed (100) InGaAs/GaAs heterostructures
Publication TypeJournal Article
Year of Publication2005
AuthorsF, R., D. J, and Á. Nemcsics
JournalPHYSICA STATUS SOLIDI C-CONFERENCES AND CRITICAL REVIEWS
Volume2
Issue4
Pagination1298 - 1303
Date Published2005
Publication Languageeng
Abstract

Structural properties of highly mismatched InGaAs/GaAs (100)heterostructures grown by molecular beam epitaxy are studied
using high-resolution X-ray diffraction. The layers are nearly
fully relaxed and show closely tetragonal distortion as shown
by asymmetric reflections. However, structural defects show an
asymmetry of the orthogonal <110> directions as revealed by
reciprocal space maps. Substrate miscut effects are accounted
for this difference.