Valuing of the critical layer thickness from the deading time constant of RHEED oscillation in the case of InxGa1-xAs/GaAs heterojunction
| Title | Valuing of the critical layer thickness from the deading time constant of RHEED oscillation in the case of InxGa1-xAs/GaAs heterojunction |
| Publication Type | Journal Article |
| Year of Publication | 2002 |
| Authors | Nemcsics, Á. |
| Journal | APPLIED SURFACE SCIENCE |
| Volume | 190 |
| Issue | 1-4 |
| Pagination | 294 - 297 |
| Date Published | 2002 |
| Publication Language | eng |