An X-ray diffraction study of the structural properties of thick relaxed (100) InGaAs/GaAs heterostructures
Title | An X-ray diffraction study of the structural properties of thick relaxed (100) InGaAs/GaAs heterostructures |
Publication Type | Conference Paper |
Year of Publication | 2005 |
Publication Language | eng |
Pagination | 1298 - 1303 |
Authors | F, R., D. J. Z, and Á. Nemcsics |
Conference Name | Physica Status Solidi C: Conferences |
Date Published | 2005 |