Relationship between the critical layer thickness and the decay-time constant of RHEED oscillation at the InGaAs/GaAs heterostructures
| Title | Relationship between the critical layer thickness and the decay-time constant of RHEED oscillation at the InGaAs/GaAs heterostructures |
| Publication Type | Conference Paper |
| Year of Publication | 2001 |
| Publication Language | eng |
| Pagination | & - |
| Authors | Nemcsics, Á. |
| Conference Name | E-MRS 2001 Spring Meeting |
| Date Published | 2001 |