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Filters: Author is Basa, P  [Clear All Filters]
2007
Wainstein, D. L., A. I. Kovalev, C. Ducso, T. Jaszi, P. Basa, Z. J. Horváth, T. Lohner, and P. Petrik, "X-ray photoelectron spectroscopy investigations of Si in non-stoichiometric SiNx LPCVD multilayered coatings", Physica E, vol. 38, pp. 156–159, 2007.
2006
Basa, P., A. S. Alagoz, T. Lohner, M. Kulakci, K. Nagy, R. Turan, and Z. J. Horváth, "Electrical and ellipsometry study of sputtered SiO2 structures containing Ge nanocrystals", 5th Solid State Surfaces and Interfaces, Extended Abstract Book, Smolenice, Slovakia, pp. 17-20, 2006.
Horváth, Z. J., P. Basa, T. Jászi, A. E. Pap, P. Szöllősi, K. Nagy, and V. Hardy, "Electrical and memory properties of non-volatile memory structures with embedded Si nanocrystals", 6th Int. Conf. Advanced Semiconductor Devices and Microsystems ASDAM`06, vol. 6, Smolenice, Slovakia, pp. 205-208, 2006.
Szöllősi, P., P. Basa, C. Dücső, B. Máté, M. Ádám, T. Lohner, P. Petrik, B. Pécz, L. Tóth, L. Dobos, et al., "Electrical and optical properties of Si-rich SiNx layers: Effect of annealing", Current Appl. Phys., vol. 6, issue 2, pp. 179-181, 2006.
Basa, P., P. Szöllősi, and Z. J. Horváth, "Electrical study of annealed silicon nitride thin layers containing excess silicon", Kando Conference 2006, Budapest, 2006.