DETERMINATION OF THE THICKNESS OF CHEMICALLY REMOVED THIN-LAYERS ON GAAS VPE STRUCTURES
| Title | DETERMINATION OF THE THICKNESS OF CHEMICALLY REMOVED THIN-LAYERS ON GAAS VPE STRUCTURES |
| Publication Type | Journal Article |
| Year of Publication | 1991 |
| Authors | K, S. O. M. O. G. Y. I., N. E. M. E. T. H. S. A. L. L. A. Y. M, and Á. Nemcsics |
| Journal | CRYSTAL RESEARCH AND TECHNOLOGY |
| Volume | 26 |
| Issue | 8 |
| Pagination | 1091 - 1097 |
| Date Published | 1991 |
| Publication Language | eng |