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Filters: Author is NEMETHSALLAY M  [Clear All Filters]
1991
K, S. O. M. O. G. Y. I., N. E. M. E. T. H. S. A. L. L. A. Y. M, and Á. Nemcsics, "DETERMINATION OF THE THICKNESS OF CHEMICALLY REMOVED THIN-LAYERS ON GAAS VPE STRUCTURES", CRYSTAL RESEARCH AND TECHNOLOGY, vol. 26, issue 8, pp. 1091 - 1097, 1991.