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Interpretation of the Depth-Dependent Etch-Pit Density in InGaAs/GaAs Heterostructures

TitleInterpretation of the Depth-Dependent Etch-Pit Density in InGaAs/GaAs Heterostructures
Publication TypeConference Paper
Year of Publication2002
Publication Languageeng
Pagination -
AuthorsNemcsics, Á., and F. Riesz
Conference NameBook of Abstracts EXMATEC 2002
Date Published2002

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