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Publications

Found 3 results

Filters: Author is Ferenc Riesz  [Clear All Filters]
2002
Nemcsics, Á., and F. Riesz, "Interpretation of the Depth-Dependent Etch-Pit Density in InGaAs/GaAs Heterostructures", Book of Abstracts EXMATEC 2002, pp. - , 2002.
Riesz, F., Á. Nemcsics, C. Vignali, and C. Pelosi, "Investigation of surface morphology of MBE growth lattice-mismatched InGaAs layers by AFM", Abstr. of XXXI Int. School on the Physics of Semiconducting Compounds, pp. 119 - , 2002.
1998
Nemcsics, Á., F. Riesz, and L. Dobos, "Selective Electrochemical Profiling of Threading Deffects in Mismatched InGaAs/GaAs Heteroepitaxial System", International Conference on Extended Defects in Semiconductors (EDS 98), pp. 15 - , 1998.