Warning: Table './science/watchdog' is marked as crashed and should be repaired query: INSERT INTO watchdog (uid, type, message, variables, severity, link, location, referer, hostname, timestamp) VALUES (0, 'php', '%message in %file on line %line.', 'a:4:{s:6:\"%error\";s:7:\"warning\";s:8:\"%message\";s:138:\"realpath(): open_basedir restriction in effect. File(/tmp) is not within the allowed path(s): (/var/www/html/science/science.uni-obuda.hu)\";s:5:\"%file\";s:60:\"/var/www/html/science/science.uni-obuda.hu/includes/file.inc\";s:5:\"%line\";i:200;}', 3, '', 'http://science.uni-obuda.hu/node/4907', '', '216.73.216.204', 1749465016) in /var/www/html/science/science.uni-obuda.hu/includes/database.mysql.inc on line 135 Warning: Table './science/watchdog' is marked as crashed and should be repaired query: INSERT INTO watchdog (uid, type, message, variables, severity, link, location, referer, hostname, timestamp) VALUES (0, 'php', '%message in %file on line %line.', 'a:4:{s:6:\"%error\";s:7:\"warning\";s:8:\"%message\";s:138:\"realpath(): open_basedir restriction in effect. File(/tmp) is not within the allowed path(s): (/var/www/html/science/science.uni-obuda.hu)\";s:5:\"%file\";s:60:\"/var/www/html/science/science.uni-obuda.hu/includes/file.inc\";s:5:\"%line\";i:200;}', 3, '', 'http://science.uni-obuda.hu/node/4907', '', '216.73.216.204', 1749465016) in /var/www/html/science/science.uni-obuda.hu/includes/database.mysql.inc on line 135 Selective electrochemical profiling of threading defects in mismatched heteroepitaxial systems | science.uni-obuda.hu
Ugrás a tartalomra

Selective electrochemical profiling of threading defects in mismatched heteroepitaxial systems

CímSelective electrochemical profiling of threading defects in mismatched heteroepitaxial systems
Közlemény típusaJournal Article
Kiadás éve1999
SzerzőkNemcsics, Á., R. F, and D. L
FolyóiratTHIN SOLID FILMS
Évfolyam343-344
Oldalszám520 - 523
Kiadás dátuma1999
Kiadás nyelveeng
Összefoglalás

The defect structure in MBE-grown (100) InGaAs/GaAsheteroepitaxial systems is studied by selective electrochemical
(anodic) etching. The In content and layer thicknesses are
between 0.03-0.3 and 0.02-5 µm respectively (above critical
layer thickness). Different aqueous electrolytes and bias
voltages are tried to optimise the etching conditions. By
incremental layer removal, we mapped the depth profile of the
dislocation density. The density of defects is inversely
proportional to the layer thickness and increases with misfit.
The results are compared to theoretical models.