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Filters: Author is DS McPhail  [Clear All Filters]
2002
Srnanek, R., R. Kinder, D. Donoval, L. Peternai, I. Novotny, J. Geurts, D. S. McPhail, R. Chater, and Á. Nemcsics, "Chemical Beveling of Si/SiGe Structures for Structure and Material Analysis by Raman Spectroscopy", Proc. of 4th Int. Conf. on Advanced Semiconductor Devices and Microsystems, pp. 195 - 198, 2002.