Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals
| Title | Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals |
| Publication Type | Journal Article |
| Year of Publication | 2008 |
| Authors | Basa, P., A. S. Alagoz, T. Lohner, M. Kulakci, R. Turan, K. Nagy, and Z. J. Horváth |
| Journal | Appl. Surf. Sci. |
| Volume | 254 |
| Pagination | 3626-3629 |
| Publication Language | English |
| ISSN Number | 0169-4332 |