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Publications

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Filters: Author is M. Kulakci  [Clear All Filters]
2008
Basa, P., A. S. Alagoz, T. Lohner, M. Kulakci, R. Turan, K. Nagy, and Z. J. Horváth, "Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals", Appl. Surf. Sci., vol. 254, pp. 3626-3629, 2008.
2006
Basa, P., A. S. Alagoz, T. Lohner, M. Kulakci, K. Nagy, R. Turan, and Z. J. Horváth, "Electrical and ellipsometry study of sputtered SiO2 structures containing Ge nanocrystals", 5th Solid State Surfaces and Interfaces, Extended Abstract Book, Smolenice, Slovakia, pp. 17-20, 2006.