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Found 6 results

Filters: Author is T Lohner  [Clear All Filters]
2008
Basa, P., A. S. Alagoz, T. Lohner, M. Kulakci, R. Turan, K. Nagy, and Z. J. Horváth, "Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals", Appl. Surf. Sci., vol. 254, pp. 3626-3629, 2008.
2007
Wainstein, D. L., A. I. Kovalev, C. Ducso, T. Jaszi, P. Basa, Z. J. Horváth, T. Lohner, and P. Petrik, "X-ray photoelectron spectroscopy investigations of Si in non-stoichiometric SiNx LPCVD multilayered coatings", Physica E, vol. 38, pp. 156–159, 2007.
2006
Lohner, T., M. Serényi, Z. Zolnai, P. Petrik, Á. Nemcsics, and N. Q. Khanh, "Spectroellipsometric characterization of sputtered amorphous silicon germanium thin films", E-MRS 2005 Spring Meeting, pp. & - , 2006.
Basa, P., A. S. Alagoz, T. Lohner, M. Kulakci, K. Nagy, R. Turan, and Z. J. Horváth, "Electrical and ellipsometry study of sputtered SiO2 structures containing Ge nanocrystals", 5th Solid State Surfaces and Interfaces, Extended Abstract Book, Smolenice, Slovakia, pp. 17-20, 2006.
Szöllősi, P., P. Basa, C. Dücső, B. Máté, M. Ádám, T. Lohner, P. Petrik, B. Pécz, L. Tóth, L. Dobos, et al., "Electrical and optical properties of Si-rich SiNx layers: Effect of annealing", Current Appl. Phys., vol. 6, issue 2, pp. 179-181, 2006.
2004
Serényi, M., T. Lohner, N. Q. Khanh, Á. Nemcsics, and P. Turmezei, "Studies on the sputtered hydrogenated amorphous SiGe thin films", Proceedings of 10th Joint Vacuum Conference, pp. 80 - 81, 2004.