Electrical and ellipsometry study of sputtered SiO2 structures containing Ge nanocrystals
| Title | Electrical and ellipsometry study of sputtered SiO2 structures containing Ge nanocrystals |
| Publication Type | Conference Proceedings |
| Year of Publication | 2006 |
| Authors | Basa, P., A. S. Alagoz, T. Lohner, M. Kulakci, K. Nagy, R. Turan, and Z. J. Horváth |
| Conference Name | 5th Solid State Surfaces and Interfaces |
| Series Title | Solid State Surfaces and Interfaces |
| Edition | Extended Abstract Book |
| Pagination | 17-20 |
| Conference Location | Smolenice, Slovakia |
| Publication Language | English |