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Filters: Author is Z Zolnai  [Clear All Filters]
2006
Lohner, T., M. Serényi, Z. Zolnai, P. Petrik, Á. Nemcsics, and N. Q. Khanh, "Spectroellipsometric characterization of sputtered amorphous silicon germanium thin films", E-MRS 2005 Spring Meeting, pp. & - , 2006.