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Publications

Found 3 results

Filters: Author is P Petrik  [Clear All Filters]
2007
Wainstein, D. L., A. I. Kovalev, C. Ducso, T. Jaszi, P. Basa, Z. J. Horváth, T. Lohner, and P. Petrik, "X-ray photoelectron spectroscopy investigations of Si in non-stoichiometric SiNx LPCVD multilayered coatings", Physica E, vol. 38, pp. 156–159, 2007.
2006
Lohner, T., M. Serényi, Z. Zolnai, P. Petrik, Á. Nemcsics, and N. Q. Khanh, "Spectroellipsometric characterization of sputtered amorphous silicon germanium thin films", E-MRS 2005 Spring Meeting, pp. & - , 2006.
Szöllősi, P., P. Basa, C. Dücső, B. Máté, M. Ádám, T. Lohner, P. Petrik, B. Pécz, L. Tóth, L. Dobos, et al., "Electrical and optical properties of Si-rich SiNx layers: Effect of annealing", Current Appl. Phys., vol. 6, issue 2, pp. 179-181, 2006.