Publications
Found 18 results
Szűrők: Szerző = L Dobos [Minden szűrő visszaállítása]
"Formation of Ge nanocrystals in SiO2 by electron beam evaporation",
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, pp. 818 - 822, Submitted.
"Development of Si nanocrystal layers embedded in Si3N4",
10th Multinational Congress on Microscopy 2011, Urbino, Italy, pp. 559-560, 09/2011.
"Charging properties of Si3N4 based structures with embedded Si or Ge nanocrystals: Experiments and simulation",
19th Int. Symp. “Nanostructures: Physics and Technology”, Ekaterinburg, Russia, pp. 207-208, 06/2011.
"Charging properties of Si3N4 based structures with embedded Si or Ge nanocrystals: Experiments and simulation",
18th Int. Symp. Nanostructures: Physics and Technology, Ekaterinburg, Russia, 2011.
"Charging behaviour of MNOS structures with embedded Si or Ge nanocrystals",
Solid State Surfaces and Interfaces SSSI 2010, 22-25 November, 2010, Smolenice, Slovakia, 11/2010.
"Al and Ti/Al contacts to n-GaN",
Vacuum, vol. 84, pp. 228–230, 2010.
"Charging behaviour of MNOS structures with embedded Si or Ge nanocrystals",
7th Solid State Surfaces and Interfaces SSSI 2010, Extended Abstract Book, Smolenice, Slovakia, pp. 36-38, 2010.
"Electrical behaviour of lateral Al/n-GaN/Al structures",
Appl. Surf. Sci., vol. 256, pp. 5614–5617, 2010.
"Anomalous electrical properties of Si/Si1–xGex heterostructures with an electron transport channel in Si layers",
Fizika Tverdogo Tela, vol. 50, issue 2, pp. 317–327, 2008.
"Electrical and memory properties of Si3N4 MIS structures with embedded Si nanocrystals",
J. Nanosci. Nanotechnol., vol. 8, pp. 812–817, 2008.
"Electrical and memory properties of Si3N4 MIS structures with embedded Si nanocrystals",
J. Nanosci. Nanotechnol., vol. 8, pp. 812–817, 2008.
"Structural and electrical properties of Au and Ti/Au contacts to n-type GaN",
Vacuum, vol. 82, pp. 794-798, 2008.
"Electrical and memory properties of silicon nitride structures with embedded Si nanocrystals",
Physica E, vol. 38, pp. 71–75, 2007.
"Nem-illékony nanokristályos félvezető memóriák",
Híradástechnika, vol. LXII., issue 10, pp. 43-46, 2007.
"Electrical and optical properties of Si-rich SiNx layers: Effect of annealing",
Current Appl. Phys., vol. 6, issue 2, pp. 179-181, 2006.
"Metal contacts to n-GaN",
Appl. Surf. Sci., vol. 253, pp. 655-661, 2006.
"Fractal Properties of Compound Semiconductor Surface after Selective Electrochemical Etching",
Abstract Book of IVC-14, ICSS-10, NANO-5, QSA-10, pp. 82 - , 1998.
"Investigation of Crystal Defects in Mismatched Heteroepitaxial Systems by Electrochemical profiling",
Abstract Book of IVC-14, ICSS-10, NANO-5, QSA-10, pp. 95 - , 1998.